failureanalysis |
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| navigate by keyword : microscope micrograph sem electron scanning circuit board pcb electronics technology damage corrosion deterioration failure analysis science engineering material component microchip computing system computer pad gold copper blue debris granular structure substrate magnified magnification macro detail minuscule scale research industry testing forensic decay residue oxide chemical environmental surface trace conductive integrated chip close high resolution scientific lab data manufacturing failureanalysis |
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| This highly detailed micrograph captures severe deterioration and corrosion on the surface of a microchip or printed circuit board. Granular blue debris covers the golden contact pads and electronic components suggesting chemical or environmental failure. Rendered by Ai, this image highlights the complex structural breakdown at a minuscule scale crucial for failure analysis and materials science |
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